Optical metrology · Software development · Image processing

Optical metrology · Software development · Image processing

  • Welcome

    • Company

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  • Exhibitions

  • Products

    • Optics Test Equipment

    • Measuring systems for drawing dies and punches

    • Drawing die and wire measurement

    • Contact angle measuring systems

    • Micro scriber, Wafer contact angle, wafer stress measurement

    • Straightness, Flatness, Positioning uncertainty by autocollimator

    • Measuring microscopes, Image processing

    • Flatness, Bow, Warp, Curvature, Glass thickness

    • Measuring systems for image intensifier tubes (IIT)

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    • COMEF

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    • Marx Crypto-Dongle Driver

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Exhibitions

 

 

 

 

 

SEMICON Europe 2024

SEMICON Europe 2024

SEMICON Europa 2024 is co-located with Electronics in Munich, Germany creating the strongest single event for electronics manufacturing in Europe and broadening the range of attendees across the electronics chain.

 

Fully automatic measuring devices with wafer robot, load port and SECS/GEM interface for the measurement of contact angle.

 

 

New!

Additional module for SURFTENS WH for the measurement of Edge Bead removal (EBR).

This means that SURFTENS WH 300 offers the possibility of combining two measurement functions in a single device, which previously required two devices. Lower investment and less space required in the clean room therefore pay off immediately for the customer.